Описание
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Затрагиваемое ПО
Qualcomm Fastconnect 6700 firmwareQualcomm Fastconnect 6700Qualcomm Fastconnect 6900 firmwareQualcomm Fastconnect 6900Qualcomm Fastconnect 7800 firmwareQualcomm Fastconnect 7800Qualcomm Qcm5430 firmwareQualcomm Qcm5430Qualcomm Qcm6490 firmwareQualcomm Qcm6490Qualcomm Qcs5430 firmwareQualcomm Qcs5430Qualcomm Qcs6490 firmwareQualcomm Qcs6490Qualcomm Video collaboration vc3 platform firmwareQualcomm Video collaboration vc3 platformQualcomm Sc8380xp firmwareQualcomm Sc8380xpQualcomm Sdm429w firmwareQualcomm Sdm429wQualcomm Snapdragon 429 mobile firmwareQualcomm Snapdragon 429 mobileQualcomm Snapdragon 7c\+ gen 3 compute firmwareQualcomm Snapdragon 7c\+ gen 3 computeQualcomm Sc8280xp-abbb firmware
CVSS
| Балл | 7.8 — высокая |
| Вектор | CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H |
Источники
https://docs.qualcomm.com/product/publicresources/securitybulletin/february-2025-bulletin.html